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Nanoscale electrodes by conducting atomic force microscopy: Oxygen reduction kinetics at the Pt|CsHSO_4 interface

机译:通过原子力显微镜观察纳米级电极:Pt | CsHSO_4界面的氧还原动力学

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We quantitatively characterized oxygen reduction kinetics at the nanoscale Pt|CsHSO_4 interface at ~ 150 °C in humidified air using conducting atomic force microscopy (AFM) in conjunction with AC impedance spectroscopy and cyclic voltammetry. From the impedance measurements, oxygen reduction at Pt|CsHSO_4 was found to comprise two processes, one displaying an exponential dependence on overpotential and the other only weakly dependent on overpotential. Both interfacial processes displayed near-ideal capacitive behavior, indicating a minimal distribution in the associated relaxation time. Such a feature is taken to be characteristic of a nanoscale interface in which spatial averaging effects are absent and, furthermore, allows for the rigorous separation of multiple processes that would otherwise be convoluted in measurements using conventional macroscale electrode geometries. The complete current-voltage characteristics of the Pt|CsHSO_4 interface were measured at various points across the electrolyte surface and reveal a variation of the oxygen reduction kinetics with position. The overpotential-activated process, which dominates at voltages below -1 V, was interpreted as a charge-transfer reaction. Analysis of six different sets of Pt|CsHSO_4 experiments, within the Butler-Volmer framework, yielded exchange coefficients (α) for charge transfer ranging from 0.1 to 0.6 and exchange currents (i_0) spanning 5 orders of magnitude. The observed counter-correlation between the exchange current and exchange coefficient indicates that the extent to which the activation barrier decreases under bias (as reflected in the value of α) depends on the initial magnitude of that barrier under open circuit conditions (as reflected in the value of i _0). The clear correlation across six independent sets of measurements further indicates the suitability of conducting AFM approaches for careful and comprehensive study of electrochemical reactions at electrolyte-metal-gas boundaries.
机译:我们使用原子力显微镜(AFM)结合交流阻抗谱和循环伏安法,在约150°C的潮湿空气中,在约150°C的纳米级Pt | CsHSO_4界面上定量表征了氧还原动力学。从阻抗测量中,发现Pt | CsHSO_4处的氧还原包括两个过程,一个过程显示出对过电势的指数依赖性,而另一个显示出对过电势的弱依赖性。两种界面过程都显示出接近理想的电容行为,表明相关联的弛豫时间中的分布最小。这样的特征被认为是纳米级界面的特征,在纳米级界面中不存在空间平均效应,而且允许严格分离多个过程,否则将在使用常规的宏观电极几何形状进行测量时费时费力。在整个电解质表面的各个点测量了Pt | CsHSO_4界面的完整电流-电压特性,揭示了氧还原动力学随位置的变化。在低于-1 V的电压下占主导地位的过电势激活过程被解释为电荷转移反应。在Butler-Volmer框架内分析六组不同的Pt | CsHSO_4实验,得出电荷转移的交换系数(α)在0.1到0.6之间,交换电流(i_0)跨越5个数量级。观察到的交换电流和交换系数之间的反相关关系表明,激活势垒在偏置下(如α值所示)下降的程度取决于该势垒在开路条件下的初始幅度(如α值所示)。 i _0的值)。六组独立测量值之间的明确相关性进一步表明,进行AFM方法适用于对电解质-金属-气体边界处的电化学反应进行仔细而全面的研究。

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