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首页> 外文期刊>ACS nano >Wafer-scale high-throughput ordered arrays of Si and Coaxial Si/Si _(1- x)Ge_x wires: Fabrication, characterization, and photovoltaic application
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Wafer-scale high-throughput ordered arrays of Si and Coaxial Si/Si _(1- x)Ge_x wires: Fabrication, characterization, and photovoltaic application

机译:硅和同轴Si / Si _(1- x)Ge_x线的晶圆级高通量有序阵列:制造,表征和光伏应用

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摘要

We have developed a method combining lithography and catalytic etching to fabricate large-area (uniform coverage over an entire 5-in. wafer) arrays of vertically aligned single-crystal Si nanowires with high throughput. Coaxial n-Si/p-SiGe wire arrays are also fabricated by further coating single-crystal epitaxial SiGe layers on the Si wires using ultrahigh vacuum chemical vapor deposition (UHVCVD). This method allows precise control over the diameter, length, density, spacing, orientation, shape, pattern and location of the Si and Si/SiGe nanowire arrays, making it possible to fabricate an array of devices based on rationally designed nanowire arrays. A proposed fabrication mechanism of the etching process is presented. Inspired by the excellent antireflection properties of the Si/SiGe wire arrays, we built solar cells based on the arrays of these wires containing radial junctions, an example of which exhibits an open circuit voltage (V_(oc)) of 650 mV, a short-circuit current density (J_(sc)) of 8.38 mA/cm~2, a fill factor of 0.60, and an energy conversion efficiency (η) of 3.26%. Such a p-n radial structure will have a great potential application for cost-efficient photovoltaic (PV) solar energy conversion.
机译:我们已经开发出一种将光刻和催化蚀刻相结合的方法,以高生产率制造垂直排列的单晶Si纳米线的大面积(在整个5英寸晶圆上均匀覆盖)阵列。还可以通过使用超高真空化学气相沉积(UHVCVD)在Si线上进一步涂覆单晶外延SiGe层来制造同轴n-Si / p-SiGe线阵列。这种方法可以精确控制Si和Si / Si / SiGe纳米线阵列的直径,长度,密度,间距,方向,形状,图案和位置,从而可以根据合理设计的纳米线阵列制造器件阵列。提出了一种蚀刻工艺的制造机理。受到Si / SiGe线阵列出色的抗反射特性的启发,我们基于包含径向结的这些线的阵列构建了太阳能电池,其中一个例子的开路电压(V_(oc))为650 mV,短路-电路电流密度(J_(sc))为8.38 mA / cm〜2,填充系数为0.60,能量转换效率(η)为3.26%。这种p-n径向结构将在具有成本效益的光伏(PV)太阳能转换中具有巨大的潜在应用。

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