Measuring molecular junctions: What is the standard?

摘要

Accurate measurements of electronic properties of molecular junctions are important for both fundamental and practical applications. Often the molecule-electrode contacts are poorly characterized, leading to wide variation in the measured resistance values. A new paper in this issue demonstrates the use of a reference molecule as an internal standard to compensate for the varying conditions of the molecular contact in conductive-tip atomic force microscopy measurements and yields consistent resistances relative to the reference despite variations in absolute resistance.