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首页> 外文期刊>ACS nano >Influence of Defects on the Charge Density Wave of ([SnSe](1+delta))(1)(VSe2)(1) Ferecrystals
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Influence of Defects on the Charge Density Wave of ([SnSe](1+delta))(1)(VSe2)(1) Ferecrystals

机译:缺陷对([SnSe](1 +δ))(1)(VSe2)(1)铁晶体的电荷密度波的影响

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摘要

A series of ferecrystalline compounds ([SnSe](1+delta))(1)(VSe2)(1) with varying Sn/V ratios were synthesized using the modulated elemental reactant technique. Temperature-dependent specific heat data reveal a phase transition at 102 K, where the heat capacity changes abruptly. An abrupt increase in electrical resistivity occurs at the same temperature, correlated with an abrupt increase in the Hall coefficient. Combined with the magnitude and nature of the specific heat discontinuity, this suggests that the transition is similar to the charge density wave transitions in transition metal dichalcogenides. An ordered intergrowth was formed over a surprisingly wide compositional range of Sn/V ratios of 0.89 <= 1 + delta <= 1.37. X-ray diffraction and transmission electron microscopy reveal the formation of various volume defects in the compounds in response to the nonstoichiometry. The electrical resistivity and Hall coefficient data of samples with different Sn/V ratios show systematic variation in the carrier concentration with the Sn/V ratio. There is no significant change in the onset temperature of the charge density wave transition, only a variation in the carrier densities before and after the transition. Given the sensitivity of the charge density wave transitions of transition metal dichalcogenides to variations in composition, it is very surprising that the charge density wave transition observed at 102 K for ([SnSe](1.15))(1)(VSe2)(1) is barely influenced by the nonstoichiometry and structural defects. This might be a consequence of the two-dimensional nature of the structurally independent VSe2 layers.
机译:使用调制元素反应技术合成了一系列具有不同Sn / V比的铁晶化合物([SnSe](1 +δ)(1)(VSe2)(1)。与温度有关的比热数据揭示了在102 K时的相变,其中热容突然变化。在相同温度下电阻率突然增加,这与霍尔系数的突然增加有关。结合比热不连续性的大小和性质,这表明该转变类似于过渡金属二卤化物中的电荷密度波转变。在令人惊讶的0.89 <= 1 +δ<= 1.37的Sn / V比的组成范围内形成有序的共生。 X射线衍射和透射电子显微镜揭示响应于非化学计量,化合物中各种体积缺陷的形成。具有不同Sn / V比的样品的电阻率和霍尔系数数据显示,载流子浓度随Sn / V比的系统变化。电荷密度波转变的起始温度没有明显变化,只有转变前后的载流子密度变化。考虑到过渡金属二卤化物的电荷密度波跃迁对成分变化的敏感性,令人惊讶的是,[[SnSe](1.15))(1)(VSe2)(1)在102 K下观察到的电荷密度波跃迁几乎不受非化学计量和结构缺陷的影响。这可能是结构独立的VSe2层的二维性质的结果。

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