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首页> 外文期刊>ACS nano >Defect chemistry of oxide nanomaterials with high surface area: Ordered mesoporous thin films of the oxygen storage catalyst CeO_2-ZrO _2
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Defect chemistry of oxide nanomaterials with high surface area: Ordered mesoporous thin films of the oxygen storage catalyst CeO_2-ZrO _2

机译:高表面积氧化物纳米材料的缺陷化学:储氧催化剂CeO_2-ZrO_2的有序介孔薄膜

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摘要

Herein we report the electrical transport properties of a series of ordered mesoporous ceria-zirconia (Ce_xZr_(1-x)O_2, referred to as mp-CZO) thin films with both a cubic structure of (17 ± 2) nm diameter pores and nanocrystalline walls. Samples over the whole range of composition, including bare CeO_2 and ZrO_2, were fabricated by templating strategies using the large diblock copolymer KLE as the structure-directing agent. Both the nanoscale structure and the chemical composition of the mesoporous materials were analyzed by a combination of scanning and transmission electron microscopy, grazing incidence small-angle X-ray scattering, X-ray photoelectron spectroscopy, and time-of-flight secondary ion mass spectrometry. The total conductivity as a function of the film composition, temperature, and oxygen partial pressure was measured using impedance spectroscopy. The mesoporous solid solutions of CeO _2-ZrO_2 prepared in this work showed a higher stability against thermal ripening than both binary oxides, making them ideal model systems to study both the charge transport properties and the oxygen storage at elevated temperatures. We find that the redox properties of nanocrystalline mp-CZO thin films differ significantly from those of bulk CZO materials reported in the literature and, therefore, propose a defect chemical model of surface regions.
机译:本文中,我们报告了一系列有序介孔二氧化铈-氧化锆(Ce_xZr_(1-x)O_2,称为mp-CZO)薄膜的电传输性质,该薄膜具有立方结构,直径为(17±2)nm,具有纳米孔墙壁。使用大二嵌段共聚物KLE作为结构导向剂,通过模板化策略制备了包括裸CeO_2和ZrO_2在内的整个组成范围的样品。通过扫描和透射电子显微镜,掠入射小角X射线散射,X射线光电子能谱和飞行时间二次离子质谱仪的组合分析了介孔材料的纳米级结构和化学组成。使用阻抗光谱法测量总电导率随膜组成,温度和氧分压的变化。这项工作中制备的CeO _2-ZrO_2的介孔固溶体比两种二元氧化物都具有更高的抗热熟稳定性,使其成为研究电荷输送性质和高温下的氧气存储的理想模型系统。我们发现,纳米晶体mp-CZO薄膜的氧化还原特性与文献中报道的块状CZO材料的氧化还原特性有很大差异,因此,提出了表面区域的缺陷化学模型。

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