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首页> 外文期刊>Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics >An investigation on the relationship between open circuit voltage and grain size for CZTSSe thin film solar cells fabricated by selenization of sputtered precursors
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An investigation on the relationship between open circuit voltage and grain size for CZTSSe thin film solar cells fabricated by selenization of sputtered precursors

机译:溅射前体硒化的CZTSSE薄膜太阳能电池开路电压与晶粒尺寸的关系研究

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摘要

The low open circuit voltage (Voc) of Cu2ZnSn(S,Se)4(CZTSSe) thin film solar cells limits their efficiency. CZTSSe absorbers were fabricated by sputtering Cu2ZnSnS4(CZTS) target and subsequent selenization treatment and then incorporated into solar cells. The influence of selenization temperature on the growth of the CZTSSe grains and device performance was examined. The absorber films were composed of a CZTSSe phase with high Se/(Se+S) ratios. As the selenization temperature was increased from 460?°C to 500?°C, the grains grew from the top to the bottom of the CZTSSe absorbers, and the averageVocof the CZTSSe solar cells increased from 284?mV to 371?mV. The band gaps (Eg), derived from external quantum efficiency (EQE) data, were approximately 1.11?eV. Activation energies (Ea) was extracted from temperature-dependent current density-voltage (J-V) measurements and used to evaluate the interface recombination level. TheEaincreased from 0.82?eV to 0.89?eV as the selenization temperature was increased, which approached theEgof CZTSSe. This was likely caused by reduced interface recombination because the grain boundaries decreased as the grains grew larger. An approximately linear relationship between the grain size andVocwas observed. The increase of grain size was achieved by optimizing the selenization temperature, which reduced interface recombination and resulted in an increasedVoc. CZTSSe solar cells were fabricated with a maximum efficiency of 8.97%.
机译:Cu2Znsn(SE,SE)4(CZTSSE)薄膜太阳能电池的低开路电压(VOC)限制了它们的效率。的CZTSSe吸收剂通过溅射Cu2ZnSnS4(CZTS)靶和随后的硒化处理,然后掺入太阳能电池制造。检查了硒化温度对CZTSSE晶粒和器件性能生长的影响。吸收膜由具有高SE /(SE + S)比的CZTSSE相。随着硒化温度从460℃升高至500Ω·℃,晶粒从CZTSSE吸收剂的顶部增长,CZTSSE太阳能电池的普通股来自284μm≤371Ωmv。从外部量子效率(EQE)数据导出的带间隙(例如)约为1.11?EV。从温度相关的电流密度 - 电压(J-V)测量中提取激活能量(EA),并用于评估界面重组水平。从0.82℃下的0.82升至0.89?EV作为硒化温度升高,这接近了COEGOF CZTSSE。这可能是由于界面重组减少而导致,因为随着晶粒增长,晶界降低。观察到晶粒尺寸与粒子尺寸之间的近似线性关系。通过优化硒化温度来实现晶粒尺寸的增加,该硒化温度降低了界面重组并导致越升高。 CZTSSE太阳能电池制备,最大效率为8.97%。

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