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Atomic layer deposited Al2O3 thin films as humidity barrier coatings for nanoparticle-based strain sensors

机译:原子层沉积Al2O3薄膜作为湿度阻挡涂层,用于基于纳米粒子的应变传感器

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摘要

Al2O3 thin films deposited by atomic layer deposition on Pt nanoparticle-based strain sensors were studied as humidity barrier coatings for sensor protection. The effect of two deposition parameters-film thickness and growth temperature-is discussed in relation to an Al2O3 coating's ability to isolate the nanoparticle surface and protect strain sensitivity from humidity variations. It is shown that transmission electron microscopy images cannot confirm the effective protection of a nanoparticle surface, thus x-ray photoelectron spectroscopy and electrical measurements have been employed. The existence of a critical thickness of the Al2O3 protective film above which resistance and gauge factor variations are suppressed during humidity change was observed at different deposition temperatures. This ability is linked with the existence of incorporated pinholes and intrinsic hydroxyl groups in the Al2O3 thin film, which are responsible for humidity transport through the oxide.
机译:研究了通过原子层沉积在Pt纳米粒子基菌株传感器上沉积的Al2O3薄膜作为传感器保护的湿度阻挡涂层。 讨论了两种沉积参数膜厚度和生长温度 - 与Al 2 O 3涂层分离纳米颗粒表面的能力并保护应变灵敏度免受湿度变化的能力进行讨论。 结果表明,透射电子显微镜图像不能确认有效保护纳米颗粒表面,从而采用X射线光电子能谱和电测量。 在不同的沉积温度下观察到抑制湿度变化的耐湿度和量因子变化的Al2O3保护膜的临界厚度。 这种能力与Al 2 O 3薄膜中的掺入的针孔和固有羟基的存在有关,这负责湿度通过氧化物。

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