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Graphene-WS2 heterostructures by a lithography free method: their electrical properties

机译:石墨烯-WS2异质结构通过光刻免费方法:它们的电气性能

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We have developed a lithography free technique for the fabrication of two-dimensional (2D) material based heterostructures. We fabricated graphene-WS2 heterostructured devices using a transmission electron microscope grid as a shadow mask and their electrical transport characteristics were studied by electrical and magneto transport measurements. Graphene was directly deposited on a Si/SiO2 substrate by radio frequency plasma enhanced chemical vapor deposition. WS2 was synthesized by first depositing WO3 followed by sulfurization. The temperature dependence of the resistance and magnetoresistance are measured for graphene, WS2, and graphene-WS2 heterostructure. At low temperatures, the transport is found to follow the variable-range hopping (VRH) process, where logarithmic R exhibits a T-1/ 3 temperature dependence, an evidence for the 2D Mott VRH transport. The measured low-field magnetoresistance also exhibits a quadratic magnetic field dependence similar to B-2, consistent with the 2D Mott VRH transport.
机译:我们开发了一种用于制造二维(2D)基质的异质结构的无光刻技术。我们使用透射电子显微镜栅格制造石墨烯-WS2异质结构,作为阴影掩模,通过电气和磁通量测量研究其电气传输特性。通过射频等离子体增强化学气相沉积,将石墨烯直接沉积在Si / SiO 2基板上。通过首先沉积WO3,然后进行硫磺合成WS2。为石墨烯,WS2和石墨烯-WS2异质结构测量抗性和磁阻的温度依赖性。在低温下,发现运输遵循可变范围跳跃(VRH)过程,其中对数R表现出T-1/3温度依赖性,这是2D Mott VRH传输的证据。测量的低现场磁阻也表现出与B-2类似的二次磁场依赖性,与2D Mott VRH传输一致。

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