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首页> 外文期刊>Synthetic Metals >Modification of electrical properties of the Au/1,1' dimethyl ferrocenecarboxylate-Si Schottky diode
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Modification of electrical properties of the Au/1,1' dimethyl ferrocenecarboxylate-Si Schottky diode

机译:Au / 1,1'二茂铁羧酸二甲酯/ n-Si肖特基二极管的电学性质的改变

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摘要

The electrical and interface state density properties of the Au/1,1' dimethyl ferrocenecarboxylate (DMFC)-Si structure have been investigated by current-voltage, capacitance-voltage and conductance-frequency methods. The Au/DMFC-Si structure exhibits a rectifying behavior with a non-ideal /-V behavior with an ideality factor greater than unity. The ideality factor and barrier height of the Au/DMFC-Si Schottky diode is lower than that of Au-Si Schottky diode. The interface state density of the diode was determined from G/ω-/plots and was of order of 5.61 x 10~(12) eV~(-1) cm~(-2). It is evaluated that the electrical properties of Au-Si diode is controlled using V dimethyl ferrocenecarboxylate organic layer and in turn, Au/DMFC-Si structure gives new electronic parameters.
机译:通过电流-电压,电容-电压和电导-频率方法研究了Au / 1,1'二茂铁羧酸二甲酯(DMFC)/ n-Si结构的电和界面态密度特性。 Au / DMFC / n-Si结构表现出具有非理想的--V行为的整流行为,其理想因子大于1。 Au / DMFC / n-Si肖特基二极管的理想因子和势垒高度低于Au / n-Si肖特基二极管的理想因子和势垒高度。二极管的界面态密度由G /ω-/曲线确定,约为5.61 x 10〜(12)eV〜(-1)cm〜(-2)。据评估,使用V二甲基二茂铁羧酸二甲酯有机层控制Au / n-Si二极管的电性能,Au / DMFC / n-Si结构又提供了新的电子参数。

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