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Role of silicon dangling bonds in the electronic properties of epitaxial graphene on silicon carbide

机译:硅悬空键在碳化硅上外延石墨烯的电子性质中的作用

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摘要

In this paper, we study the electronic properties of epitaxial graphene (EG) on silicon carbide by means of ab initio calculations based on the local spin density approximation. + U method taking into account the Coulomb interaction between Si localized electrons. We show that this interaction is not completely suppressed but is screened by carbon layers grown on-top of silicon carbide. This finding leads to a good qualitative understanding of the experimental results reported on EG on silicon carbide. Our results highlight the presence of the Si localized states and might explain the anomalous Hanle curve and the high values of spin relaxation time in EG.
机译:在本文中,我们通过基于局部自旋密度近似的从头算来研究碳化硅上外延石墨烯(EG)的电子性能。 + U方法考虑了Si局部电子之间的库仑相互作用。我们表明,这种相互作用并没有被完全抑制,而是被碳化硅顶部生长的碳层所屏蔽。这一发现使人们对在EG上有关碳化硅的实验结果有了很好的定性理解。我们的结果突出了Si局部状态的存在,并可能解释了异常的Hanle曲线和EG中自旋弛豫时间的高值。

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