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Growth parameter design for homogeneous material composition in ternary GaxIn1-xP nanowires

机译:三元GaxIn1-xP纳米线中均匀材料成分的生长参数设计

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摘要

Ternary nanowires (NWs) often exhibit varying material composition along the NW growth axis because of different diffusion properties of the precursor molecules. This constitutes a problem for optoelectronic devices for which a homogeneous material composition is most often of importance. Especially, ternary GaInP NWs grown under a constant Ga-In precursor ratio typically show inhomogeneous material composition along the length of the NW due to the complexity of low temperature precursor pyrolysis and relative rates of growth species from gas phase diffusion and surface diffusion that contribute to synthesis of particle-assisted growth. Here, we present the results of a method to overcome this challenge by in situ tuning of the trimethylindium molar fraction during growth of ternary Zn-doped GaInP NWs. The NW material compositions were determined by use of x-ray diffraction, scanning transmission electron microscopy and energy dispersive x-ray spectroscopy and the optical properties by photoluminescence spectroscopy.
机译:由于前体分子的扩散特性不同,三元纳米线(NWs)通常沿NW生长轴显示不同的材料组成。对于光电子器件而言,这是一个问题,对于光电子器件而言,均匀的材料组成最重要。特别地,由于低温前驱体热解的复杂性以及气相扩散和表面扩散引起的生长物种的相对速率,在恒定的Ga-In前驱体比率下生长的三元GaInP NW通常沿着NW的长度显示出不均匀的材料组成。粒子辅助生长的合成。在这里,我们介绍了通过在三元锌掺杂的GaInP NWs生长过程中原位调节三甲基铟摩尔分数来克服这一挑战的方法的结果。通过使用X射线衍射,扫描透射电子显微镜和能量色散X射线光谱法测定NW材料组成,并通过光致发光光谱法测定光学性质。

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