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An improved loop test for experimentally approaching the intrinsic strength of alumina nanoscale whiskers

机译:改进的回路试验,通过实验可接近氧化铝纳米晶须的固有强度

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摘要

An improved loop test, which consists of twisting a loop in a nanoscale whisker adhered to a transmission electron microscopy (TEM) grid or other flat substrate and pulling the ends until the loop breaks, was developed for experimentally approaching the intrinsic strength of the whisker material. Alumina whiskers with diameters in the 82-320 nm range, as test targets, exhibited an average fracture strength of 39.1 GPa with a maximum of 48.8 ± 1.8 GPa, which is close to the theoretical prediction of ~46 GPa. In situ TEM fracture analysis demonstrated the brittle fracture of alumina whiskers with thicknesses down to 82 nm. Conventional SEM/TEM imaging induced fracture of the whisker loops that had experienced high strain and a possible mechanism were discussed.
机译:为了通过实验接近晶须材料的内在强度,开发了一种改进的回路试验,该回路试验包括在粘附到透射电子显微镜(TEM)网格或其他平坦基板的纳米级晶须上扭曲一个回路,并拉动末端直到回路断裂,从而形成了一种改进的回路测试。 。直径在82-320 nm范围内的氧化铝晶须作为测试目标,表现出39.1 GPa的平均断裂强度,最大值为48.8±1.8 GPa,接近理论预测值〜46 GPa。原位TEM断裂分析表明,氧化铝晶须的脆性断裂厚度低至82 nm。讨论了常规SEM / TEM成像引起的晶须环断裂,该晶须环经历了高应变,并探讨了可能的机理。

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