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Cleaved-edge-overgrowth nanogap electrodes

机译:裂边过度生长纳米间隙电极

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摘要

We present a method to fabricate multiple metal nanogap electrodes of tailored width and distance in parallel, on the cleaved plane of a GaAs/AlGaAs heterostructure. The three-dimensional patterned structures are obtained by a combination of molecular-beam-epitaxial regrowth on a crystal facet, using the cleaved-edge-overgrowth (CEO) method, and subsequent wet selective etching and metallization steps. SEM and AFM studies reveal smooth and co-planar electrodes of width and distance of the order of 10 nm. Preliminary electrical characterization indicates electrical gap insulation in the 100 MΩ range with kΩ lead resistance. We propose our methodology to realize multiple electrode geometries that would allow investigation of the electrical conductivity of complex nanoscale objects such as branched organic molecules.
机译:我们提出了一种在GaAs / AlGaAs异质结构的分裂平面上平行制造多个具有定制宽度和距离的金属纳米间隙电极的方法。三维图案化结构是通过使用切割边缘过长生长(CEO)方法结合晶体面上的分子束外延再生长,以及随后的湿法选择性蚀刻和金属化步骤而获得的。 SEM和AFM研究表明,光滑且共面的电极的宽度和距离约为10 nm。初步的电气特性表明,绝缘电阻在100MΩ范围内,引线电阻为kΩ。我们提出了实现多种电极几何形状的方法,以研究复杂的纳米级物体(如支链有机分子)的电导率。

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