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Nonlinear differential equations for the wavefront surface at arbitrary Hartmann-plane distances

机译:任意Hartmann平面距离下的波前表面的非线性微分方程

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摘要

In the Hartmann test, a wave aberration function W is estimated from the information of the spot diagram drawn in an observation plane. The distance from a reference plane to the observation plane, the Hartmann-plane distance, is typically chosen as z = f, where f is the radius of a reference sphere. The function W and the transversal aberrations {X, Y} calculated at the plane z = f are related by two well-known linear differential equations. Here, we propose two nonlinear differential equations to denote a more general relation between W and the transversal aberrations {U, V} calculated at any arbitrary Hartmann-plane distance z = r. We also show how to directly estimate the wavefront surface w from the information of {U, V}. The use of arbitrary r values could improve the reliability of the measurements of W, or w, when finding difficulties in adequate ray identification at z = f. (C) 2016 Optical Society of America
机译:在哈特曼测试中,根据在观察平面上绘制的点图的信息来估计波像差函数W。从参考平面到观察平面的距离(哈特曼平面距离)通常选择为z = f,其中f是参考球体的半径。函数W和在平面z = f处计算出的横向像差{X,Y}与两个众所周知的线性微分方程有关。在这里,我们提出了两个非线性微分方程,以表示W和在任意Hartmann平面距离z = r上计算出的横向像差{U,V}之间的更一般的关系。我们还展示了如何根据{U,V}的信息直接估计波前表面w。当在z = f处无法正确识别光线时,使用任意r值可以提高W或w的测量的可靠性。 (C)2016美国眼镜学会

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