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Sampling and error analysis of radial symmetric interpolation for fast hologram generation

机译:用于快速全息图生成的径向对称插值的采样和误差分析

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In this paper, we present a fast hologram pattern generation method by radial symmetric interpolation, which exploits concentric redundancy of a point hologram pattern to reduce computational complexity in hologram pattern calculation, and analyze the quality degradation sources in the proposed method. Compared to the analytic method in which phase and amplitude information is directly calculated from a wave equation, in our method a Fresnel zone plate is periodically sampled along a diagonal line and the wave information of a point hologram is calculated by linear interpolation. During these sampling and interpolation processes, the wave information can be modified from the original signal and the reconstruction quality can be degraded compared to the analytic pattern calculation method. The effects of sampling and linear interpolation are investigated in spatial and frequency domains. (C) 2015 Optical Society of America
机译:在本文中,我们提出了一种通过径向对称插值的快速全息图生成方法,该方法利用点全息图的同心冗余来减少全息图计算中的计算复杂性,并分析该方法的质量下降源。与直接从波动方程中计算相位和幅度信息的分析方法相比,在我们的方法中,沿着对角线定期采样菲涅耳波带片,并通过线性插值计算点全息图的波动信息。在这些采样和内插过程中,与解析模式计算方法相比,波信息可能会从原始信号中修改,并且重构质量可能会下降。在空间和频域中研究了采样和线性插值的影响。 (C)2015年美国眼镜学会

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