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首页> 外文期刊>Applied optics >Estimation of the composition of coelectron-beam-evaporated thin-mixture films by making use of the Wiener bounds
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Estimation of the composition of coelectron-beam-evaporated thin-mixture films by making use of the Wiener bounds

机译:利用维纳定律估算共电子束蒸发的薄膜混合物的组成

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摘要

Material mixtures offer prospective possibilities for synthesizing coating materials with tailored optical constants. We present experimental results for mixture coatings of alumina/aluminum fluoride and alumina/hafnia deposited by electron beam evaporation. Thereby, the volume filling factors of the components are commonly estimated on the basis of deposition rates measured by quartz crystal microbalance. The interplay between the vapor fluxes from the two evaporation sources, the crosstalk between quartz crystal microbalances, and the influence of the plasma source on the tooling factors limit the accuracy of this estimation, and this has motivated us to develop an alternative approach. The general idea of our approach is based on the commonly high accuracy in thin-film optical constant determination using spectrophotometry. Therefore, these optical constants serve as a reliable input for a rather simple but robust evaluation procedure based on the concept of Wiener bounds. The consistency of the obtained results is illustrated by opposing the data to the elementary film composition estimated from energy-dispersive x-ray spectroscopy. (c) 2015 Optical Society of America
机译:材料混合物为合成具有定制光学常数的涂料提供了可能。我们介绍了通过电子束蒸发沉积的氧化铝/氟化铝和氧化铝/氧化mixture的混合涂层的实验结果。因此,通常基于通过石英晶体微量天平测量的沉积速率来估计组分的体积填充因子。来自两个蒸发源的蒸气通量之间的相互作用,石英晶体微量天平之间的串扰以及等离子体源对工具系数的影响限制了此估计的准确性,这促使我们开发了另一种方法。我们方法的总体思想是基于使用分光光度法测定薄膜光学常数时通常具有很高的准确性。因此,基于维纳边界的概念,这些光学常数可作为相当简单但可靠的评估过程的可靠输入。通过将数据与从能量色散X射线光谱法估算的基本膜组成相反,可以说明所获得结果的一致性。 (c)2015年美国眼镜学会

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