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Impact of LOCOS techniques on photonic wire waveguides

机译:LOCOS技术对光子线波导的影响

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摘要

We use the LOCal oxidation of silicon (LOCOS) method as a fabrication technique to define submicrometer photonic waveguides. We attempted fabricating the wire waveguides with two different masking processes, one with a stack of pad oxide and silicon nitride layers, and the other with a single silicon nitride layer. The smallest waveguide we achieved had a cross-section profile of 280 nm × 650 nm. The propagation loss of the waveguides was measured by the cut-back method, and the bending loss was measured by employing the serpentine pattern. The minimum propagation loss achieved was 8.78 dB /cm and the bending loss was 0.0089 dB /90° bend for a 5 μm bending radius.
机译:我们使用硅的LOCal氧化(LOCOS)方法作为制造技术来定义亚微米光子波导。我们尝试用两种不同的掩膜工艺来制造线波导,一种是具有一叠的垫氧化物和氮化硅层,另一种是具有单个氮化硅层。我们获得的最小的波导的横截面轮廓为280 nm×650 nm。通过切回法测量波导的传播损耗,并且通过采用蛇形图案来测量弯曲损耗。对于5μm的弯曲半径,实现的最小传播损耗为8.78dB / cm,弯曲损耗为0.0089dB / 90°弯曲。

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