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Influence of hydrogen on the properties of Al and Ga-doped ZnO films at room temperature

机译:氢对室温下Al和Ga掺杂ZnO薄膜性能的影响

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摘要

Low resistivity and high transmittance of Al-doped ZnO (AZO) and Ga-doped ZnO (GZO) transparent conductive thin films have been achieved by use of pulsed dc magnetron sputtering in a hydrogen environment at room temperature. The addition of hydrogen to the sputtering gas can reduce the resistivity of the films and improve their electrical properties compared to those prepared without H_(2), because the hydrogen acts a shallow donor. The average transmittance was over 85percent in the visible region, and the lowest resistivity of the AZO and GZO films was 4.01 X 10~(-4) (OMEGA-cm) and 4.39 X 10~(-4) (OMEGA-cm), respectively.
机译:通过在室温下在氢气环境中使用脉冲直流磁控溅射,已实现了Al掺杂ZnO(AZO)和Ga掺杂ZnO(GZO)透明导电薄膜的低电阻率和高透射率。与不使用H_(2)制备的薄膜相比,向溅射气体中添加氢气可以降低薄膜的电阻率并改善薄膜的电性能,因为氢气的作用力很浅。在可见光区域平均透射率超过85%,AZO和GZO膜的最低电阻率分别为4.01 X 10〜(-4)(OMEGA-cm)和4.39 X 10〜(-4)(OMEGA-cm),分别。

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