Rotation angle measurement based on white-light interferometry with a standard optical flat

摘要

We propose a simple white-light interferometric method of measuring a one-dimensional rotation angle with use of an optical plane parallel plate of standard refractive index. The phase change of the interference pattern of the interferometer during the rotation of the flat plate of known refractive index and thickness placed in one of the interferometer's arms is used for determination of the rotation angle. This method has been demonstrated for an accurate angle measurement over the angle range from 0 deg to 40 deg within a maximum uncertainty of 0.057 deg.