A new method of optical imaging that can generate the section images of arbitrarily tilted planes has been developed from illumination-angle-scanning digital interference holography. A set of complex object fields are reconstructed from the holograms captured as the illumination angle is varied with uniform intervals. After the complex fields are modified with phase ramps that match the tilt (relative to the hologram plane) of a desired observation plane, the image of the object sliced along the tilted plane is obtained from their superposition. The axial resolution of a system employing this method is measured with a step height standard, and it is applied to the tomographic inspection of a microelectromechanical system.
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