Interferometric measurement of the temperature dependence of an index of refraction: application to fused silica

摘要

The light reflected by an uncoated Fabry-Perot etalon presents dark rings which give a very sensitive measurement of the variations of the return optical path in the etalon. By measuring the diameters of these rings as a function of the etalon temperature T, we get a sensitive measurement of the derivative dn/dT of the index of refraction n. We have made this experiment with a fused silica etalon and we have achieved a 2percent relative uncertainty on dn/dT, comparable to the uncertainty of the best experiments.