Single-longitudinal-mode scan of a pulsed double-grating Ti:sapphire oscillator

摘要

The method of the single-longitudinal-mode (SLM) scan of a pulsed double-grating Ti:sapphire laser oscillatorwith the grazing incidence cavity configuration was proposed based on the analysis of the optical path length. The SLM scan was experimentally confirmed for this cavity configuration, where the second grating was rotated around an arbitrary point with the translational scan of a back mirror.