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Heterodyne wavelength meter for continuous-wave lasers

机译:用于连续波激光器的外差波长计

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摘要

A wavelength meter based on a heterodyne interferometer is presented. A single-wavelength test laserbeam is modulated to two orthogonal linearly polarized components with different frequencies by a pair of acousto-optic modulators. Then the modulated laser beam and a two-wavelength laser beam are sent to a heterodyne interferometer in a common path. The ratio of two laser interference phase shifts in the heterodyne interferometer is equal to the ratio of their wavelengths. The heterodyne technique measures the heterodyne interference phase but not the interference intensity, which means that it could measure a light source whose intensity is not stable. The heterodyne interference signal is an alternating signal that can easily magnify and process the circuit that makes up the heterodyne wavelength meter and could be used to measure the low-intensity light source even when there are environmental disturbances. A tunable diode laser wavelength range of 630-637 nm has been measured to an accuracy of 5 parts in 10~(7).
机译:提出了一种基于外差干涉仪的波长仪。通过一对声光调制器将单波长测试激光束调制为具有不同频率的两个正交线性偏振分量。然后,将经调制的激光束和两波长激光束在公共路径中发送到外差干涉仪。外差干涉仪中两个激光干涉相移的比率等于其波长的比率。外差技术测量的是外差干涉相位,而不是干涉强度,这意味着它可以测量强度不稳定的光源。外差干扰信号是一种交流信号,可以轻松地放大和处理组成外差波长计的电路,即使存在环境干扰,也可以用于测量低强度光源。在10〜(7)中,测得的可调二极管激光器波长范围为630-637 nm,精度为5份。

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