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首页> 外文期刊>Angewandte Chemie >Half-Metallicity in Single-Layered Manganese Dioxide Nanosheets by Defect Engineering
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Half-Metallicity in Single-Layered Manganese Dioxide Nanosheets by Defect Engineering

机译:缺陷工程技术在单层二氧化锰纳米片中的半金属化

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Defect engineering is considered as one of the most efficient strategies to regulate the electronic structure of materials and involves the manipulation of the types, concentrations, and spatial distributions of defects, resulting in unprecedented properties. It is shown that a single-layered MnO2 nanosheet with vacancies is a robust half-metal, which was confirmed by theoretical calculations, whereas vacancy-free single-layered MnO2 is a typical semiconductor. The half-metallicity of the single-layered MnO2 nanosheet can be observed for a wide range of vacancy concentrations and even in the co-presence of Mn and O vacancies. This work enables the development of half-metals by defect engineering of well-established low-dimensional materials, which may be used for the design of next-generation paper-like spintronics.
机译:缺陷工程被认为是调节材料电子结构的最有效策略之一,涉及对缺陷的类型,浓度和空间分布的操纵,从而产生了前所未有的性能。结果表明,具有空位的单层MnO2纳米片是坚固的半金属,这已通过理论计算得到证实,而无空位的单层MnO2是典型的半导体。可以在宽范围的空位浓度下,甚至在同时存在Mn和O空位的情况下,观察到单层MnO2纳米片的半金属性。这项工作可以通过对成熟的低尺寸材料进行缺陷工程来开发半金属,该材料可用于设计下一代纸质自旋电子器件。

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