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Mapping of the Photoinduced Electron Traps in TiO2 by Picosecond X-ray Absorption Spectroscopy

机译:皮秒X射线吸收光谱法测定TiO2中的光致电子陷阱

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Titanium dioxide (TiO2) is the most popular material for applications in solar-energy conversion and photocatalysis, both of which rely on the creation, transport, and trapping of charges (holes and electrons). The nature and lifetime of electron traps at room temperature have so far not been elucidated. Herein, we use picosecond X-ray absorption spectroscopy at the Ti K-edge and the Ru L3-edge to address this issue for photoexcited bare and N719-dye-sensitized anatase and amorphous TiO2 nanoparticles. Our results show that 100 ps after photoexcitation, the electrons are trapped deep in the defect-rich surface shell in the case of anatase TiO2, whereas they are inside the bulk in the case of amorphous TiO2. In the case of dye-sensitized anatase or amorphous TiO2, the electrons are trapped at the outer surface. Only two traps were identified in all cases, with lifetimes in the range of nanoseconds to tens of nanoseconds.
机译:二氧化钛(TiO2)是用于太阳能转换和光催化的最流行材料,两者都依赖于电荷(空穴和电子)的产生,传输和俘获。迄今为止,尚未阐明室温下电子陷阱的性质和寿命。在本文中,我们在Ti K边缘和Ru L3边缘使用皮秒X射线吸收光谱法来解决光激发的裸露和N719染料敏锐的锐钛矿和无定形TiO2纳米粒子的这一问题。我们的结果表明,光激发后100 ps,在锐钛矿型TiO2的情况下,电子被深陷在富缺陷的表面壳层中,而在非晶态TiO2的情况下,电子在块体内。在染料敏锐钛矿或无定形TiO2的情况下,电子被捕获在外表面。在所有情况下,仅识别出两个陷阱,其寿命在纳秒到几十纳秒的范围内。

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