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首页> 外文期刊>Journal of Low Power Electronics >Defect Tolerant Voter Designs Based on Transistor Redundancy
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Defect Tolerant Voter Designs Based on Transistor Redundancy

机译:基于晶体管冗余的容错选民设计

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摘要

This paper addresses defect-tolerant voter designs, using Transistor Redundancy (TR). Six to seven redundant transistors are added to a regular defect-prone voter to make it defect-tolerant. "Triple Modular Redundancy" (TMR) n-bit adders, made more robust in masking defects due to the use of our new voters designs, were simulated. An increase of less than 6% in transistor count and 1% in time delay were recorded for a TMR 64-bit adder compared to that based on defect-intolerant voter. Also, its power dissipation increased by less than 1% due to the added redundant transistors. Therefore the area, time delay, and power dissipation penalties, due to the added redundant transistors, are very small relative to the significant improvement of the designed circuits in tolerating permanent defects.
机译:本文使用晶体管冗余(TR)解决了容错选民的设计问题。六到七个冗余晶体管被添加到一个经常出现缺陷的投票器中,以使其具有容错性。模拟了“三重模块冗余”(TMR)n位加法器,由于使用了我们的新选民设计,在掩盖缺陷方面更加强大。与基于缺陷容忍投票者的TMR 64位加法器相比,TMR 64位加法器的晶体管计数增加了不到6%,延迟时间增加了1%。此外,由于增加了冗余晶体管,其功耗增加了不到1%。因此,相对于设计电路在承受永久性缺陷方面的显着改进,由于增加了冗余晶体管,面积,时间延迟和功耗损失非常小。

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