X-RAY SCATTERING ON STACKING FAULTS IN 123 CRYSTALS CONSIDERING LOCAL CHANGES OF DISTANCES BETWEEN ATOMIC LAYERS

摘要

Spatial distribution of X-ray diffusion scattering intensity conditioned by additional CuO atomic layers [stacking faults (SF)] in the AB(2)CU(3)O(7-x) (123) structure has been studied within a cinematic approach. Natural laws of diffraction-pattern changes caused by increase of SF density and by local changes of interplanar distances of atomic layers in the vicinity of SFs were obtained. The X-ray method for determination of the SF density and local changes of interplanar distances is described. [References: 9]