Foreword for the special issue on the Eighth International Workshop on Low Energy Electron Microscopy and Photoemission Electron Microscopy

摘要

The Eighth International Workshop on Low Energy Electron Microscopy and Photoemission Electron Microscopy (LEEM/PEEM-8) was held in Hong Kong, China on 11-15 November 2012. The Workshop is a biennial meeting devoted to disseminating knowledge and promoting development and applications of cathode lens microscopy, including LEEM, PEEM, spin polarized LEEM, synchrotron and laboratory-based spectroscopic PEEM, and related techniques. Although the workshop series has been ongoing for fourteen years, LEEM/PEEM-8 marked the Golden Anniversary of the first publication on LEEM [1] by the inventor of this technique, Ernst Bauer.