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首页> 外文期刊>IEEE Journal of Solid-State Circuits >Breakdown in millimeter-wave power InP HEMTs: a comparison withGaAs PHEMT's
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Breakdown in millimeter-wave power InP HEMTs: a comparison withGaAs PHEMT's

机译:毫米波功率InP HEMT的细分:与GaAs PHEMT的比较

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摘要

In spite of their outstanding transport characteristics, InPnhigh-electron mobility transistors (HEMTs) deliver lower output powernthan GaAs pseudomorphic HEMTs (PHEMTs) throughout most of thenmillimeter-wave regime. However, the superior power-added efficiency ofnInP HEMTs when compared with GaAs PHEMTs makes this technologynattractive for many applications. The reason for the relatively inferiornpower output of InP HEMTs lies in their comparatively small off-statenand on-state breakdown voltages. This paper reviews the state ofnknowledge regarding the physics of breakdown voltage in InP HEMTs,nplacing it in contrast with GaAs PHEMTs. It also presents currentnunderstanding regarding burnout, a closely related phenomenon. Thisnpaper concludes by discussing strategies for improving the breakdownnvoltage and the power output of InP HEMTs
机译:尽管InPn高电子迁移率晶体管(HEMT)具有出色的传输特性,但在整个毫米波范围内,其输出功率均低于GaAs伪形HEMT(PHEMT)。然而,与GaAs PHEMT相比,nInP HEMT出色的功率附加效率使该技术对许多应用没有吸引力。 InP HEMT的输出功率相对较低的原因在于它们的断态电压和导通状态击穿电压都较小。本文回顾了有关InP HEMT击穿电压物理特性的知识状态,并与GaAs PHEMT进行了对比。它还提出了关于倦怠的当前认识,倦怠是一个密切相关的现象。本文通过讨论改善InP HEMT的击穿电压和功率输出的策略作为总结。

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