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首页> 外文期刊>IEEE Journal of Solid-State Circuits >Measurements and analysis of PLL jitter caused by digital switchingnoise
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Measurements and analysis of PLL jitter caused by digital switchingnoise

机译:数字开关噪声引起的PLL抖动的测量和分析

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When integrating analog and digital circuits onto a mixed-modenchip, power supply noise coupling is a major limitation on thenperformance of the analog circuitry. Several techniques exist fornreducing the noise coupling, of which one of the cheapest is separatingnthe power supply distribution networks for the analog and digitalncircuits. Noise coupling from a digital noise-generating circuit throughnthe power supply/substrate into an analog phase-locked loop (PLL) isnanalyzed for three different power supply schemes. The main mechanismsnfor noise coupling are identified by comparing different PLLs andnvarying their bandwidths. It is found that the main cause of jitternstrongly depends on the power supply configuration of the PLL.nMeasurements were done on mixed-mode designs in a standard 0.25-Μmndigital CMOS process with a low-resistivity substrate. The same circuitsnwere also implemented with triple-well processing for comparisons
机译:当将模拟和数字电路集成到混合模式芯片上时,电源噪声耦合是模拟电路性能的主要限制。存在几种用于减少噪声耦合的技术,其中最便宜的一种是将用于模拟电路和数字电路的电源分配网络分开。针对三种不同的电源方案,分析了数字噪声产生电路通过电源/基板到模拟锁相环(PLL)的噪声耦合。通过比较不同的PLL并改变其带宽来确定噪声耦合的主要机制。发现抖动的主要原因很大程度上取决于PLL的电源配置。n测量是在具有低电阻率基板的标准0.25 Mmn数字CMOS工艺中的混合模式设计上完成的。相同的电路也采用三阱处理进行比较

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