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ZrSiO_4 ceramics for microwave integrated circuit applications

机译:用于微波集成电路的ZrSiO_4陶瓷

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摘要

The sintering temperature of ZrSiO_4 ceramic was optimized by studying the variation of density as a function of temperature. The dielectric properties were investigated at the radio and microwave frequencies. It has ε_r = 10.5, tan δ = 0.0016 (at 1 MHz). ε_r = 7.4, tan δ = 0.0006 (at 5.15 GHz) and T_ε = 225 ppm/℃ (at 1 MHz). The ceramic exhibited a negative coefficient of thermal expansion (CTE) of - 2.4 ppm/℃ in the temperature range of 30-800 ℃.
机译:通过研究密度随温度的变化,优化了ZrSiO_4陶瓷的烧结温度。在无线电和微波频率下研究介电性能。它具有ε_r= 10.5,tanδ= 0.0016(在1 MHz时)。 ε_r= 7.4,tanδ= 0.0006(在5.15 GHz下),T_ε= 225 ppm /℃(在1 MHz下)。在30-800℃的温度范围内,陶瓷的负热膨胀系数(CTE)为-2.4 ppm /℃。

著录项

  • 来源
    《Materials Letters》 |2011年第7期|p.1092-1094|共3页
  • 作者单位

    Materials and Minerals Division, National Institute for Interdisciplinary Science and Technology (CSIR), Thiruvananthapuram 6.9.5019, India;

    Materials and Minerals Division, National Institute for Interdisciplinary Science and Technology (CSIR), Thiruvananthapuram 6.9.5019, India;

    Materials and Minerals Division, National Institute for Interdisciplinary Science and Technology (CSIR), Thiruvananthapuram 6.9.5019, India;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    ceramics; dielectrics; electronic materials; microstructure; ftir; x-ray techniques;

    机译:陶瓷;电介质电子材料;微观结构ftir;X射线技术;

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