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首页> 外文期刊>Journal of Microelectronics and Electronic Packaging >High-Density Interconnect Technology Assessment of Printed Circuit Boards for Space Applications
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High-Density Interconnect Technology Assessment of Printed Circuit Boards for Space Applications

机译:用于空间应用的印刷电路板的高密度互连技术评估

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摘要

High-density interconnect (HDI) printed circuit boards (PCBs) and associated assemblies are essential to allow space projects to benefit from the ever increasing complexity and functionality of modern integrated circuits such as field-programmable gate arrays, digital signal processors and application processors. Increasing demands for functionality translate into higher signal speeds combined with an increasing number of input/outputs (I/Os). To limit the overall package size, the contact pad pitch of the components is reduced. The combination of a high number of I/Os with a reduced pitch places additional demands onto the PCB, requiring the use of laser-drilled microvias, high-aspect ratio core vias, and small track width and spacing. Although the associated advanced manufacturing processes have been widely used in commercial, automotive, medical, and military applications, reconciling these advancements in capability with the reliability requirements for space remains a challenge. Two categories of the HDI technology are considered: two levels of staggered microvias (basic HDI) and (up to) three levels of stacked microvias (complex HDI). In this article, the qualification of the basic HDI technology in accordance with ECSS-Q-ST-70-60C is described. At 1.0-mm pitch, the technology passes all testing successfully. At .8-mm pitch, failures are encountered during interconnection stress testing and conductive anodic filament testing. These failures provide the basis for updating the design rules for HDI PCBs.
机译:高密度互连(HDI)印刷电路板(PCB)和相关组件对于允许空间项目是必不可少的,以便从现代集成电路(例如现场可编程门阵列,数字信号处理器和应用处理器)中增加的复杂性和功能。越来越多的功能需求转化为更高的信号速度与越来越多的输入/输出(I / O)组合。为了限制整个封装尺寸,减少了部件的接触焊盘间距。具有减小的间距的大数量I / O的组合将额外的要求放在PCB上,需要使用激光钻孔微宽,高纵横比核心通孔和小轨道宽度和间隔。虽然相关的先进制造工艺已广泛用于商业,汽车,医疗和军事应用,但调整这些进步的空间可靠性要求仍然是一个挑战。两类HDI技术被认为是:两级交错的微血症(基本HDI)和(最多)三级堆叠的微潜水(复杂HDI)。在本文中,描述了根据ECSS-Q-ST-70-60C的基本HDI技术的资格。在1.0毫米间距,该技术通过所有测试成功传递。在互连应力测试和导电阳极灯丝测试期间遇到了.8-mm间距,遇到故障。这些故障为更新HDI PCB的设计规则提供了基础。

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