...
首页> 外文期刊>IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control >Plane Wave Imaging Techniques for Immersion Testing of Components With Nonplanar Surfaces
【24h】

Plane Wave Imaging Techniques for Immersion Testing of Components With Nonplanar Surfaces

机译:具有非平面表面浸没测试的平面波成像技术

获取原文
获取原文并翻译 | 示例
           

摘要

Plane wave imaging (PWI) is an ultrasonic array imaging technique used in nondestructive testing, which has been shown to yield high resolution with few transmissions. Only a few published examples are available of PWI of components with nonplanar surfaces in immersion. In these cases, inspections were performed by adapting the transmission delays in order to produce a plane wave inside the component. This adaptation requires prior knowledge of the component geometry and position relative to the array. This article proposes a new implementation, termed PWI adapted in postprocessing (PWAPP), which has no such requirement. In PWAPP, the array emits a plane wave as in conventional PWI. The captured data are input into two postprocessing stages. The first reconstructs the surface of the component; the latter images inside of it by adapting the delays to the distortion of the plane waves upon refraction at the reconstructed surface. Simulation and experimental data are produced from an immersed sample with a concave front surface and artificial defects. These are processed with conventional and surface corrected PWI. Both algorithms involving surface adaptation produced nearly equivalent results from the simulated data, and both outperform the nonadapted one. Experimentally, all defects are imaged with a signal-to-noise ratio (SNR) of at least 31.8 and 33.5 dB for, respectively, PWAPP and PWI adapted in transmission but only 20.5 dB for conventional PWI. In the cases considered, reducing the number of transmissions below the number of array elements shows that PWAPP maintains its high SNR performance down to the number of firings equivalent to a quarter of the array elements. Finally, experimental data from a more complex surface specimen are processed with PWAPP resulting in detection of all scatterers and producing SNR comparable to that of the total focusing method.
机译:平面波成像(PWI)是一种用于非破坏性测试的超声波阵列成像技术,已经显示出具有少量变速箱的高分辨率。只有少数公布的示例可以使用浸没中的非平面曲面的PWI。在这些情况下,通过调整传输延迟以在部件内产生平面波来进行检查。这种适配需要先验知识,相对于阵列相对于阵列的组件几何形状和位置。本文提出了一个新的实施,被称为在后处理(PWAPP)中的PWI,其没有此类要求。在PWAPP中,阵列将平面波作为传统的PWI发出。捕获的数据被输入到两个后处理阶段。首先重建组件的表面;通过在重建表面折射时将延迟调整到平面波的失真内部的后一个图像。仿真和实验数据由具有凹形前表面和人工缺陷的浸渍样品产生。这些通过常规和表面校正的PWI处理。涉及表面适配的这两种算法产生了来自模拟数据的几乎等同的结果,并且都优于非接纳的算法。通过实验,所有缺陷分别以至少31.8和33.5dB的信噪比(SNR)成像,PWAPP和PWI适用于传输,但对于传统的PWI仅为20.5dB。在考虑的情况下,减少低于数组元素的传输次数,示出了PWAPP将其高SNR性能降至等于阵列元素的四分之一的次数。最后,通过PWAPP处理来自更复杂的表面样本的实验数据,导致所有散射体检测并产生与总聚焦方法相当的SNR。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号