Comparison of phase noise simulation techniques on a BJT LC oscillator

摘要

The phase noise resulting from white and flicker noise in a bipolar junction transistor (BJT) LC oscillator is investigated. Large signal transient time domain SPICE simulations of phase noise resulting from the random-phase flicker and white noise in a 2 GHz BJT LC oscillator have been performed and demonstrated. The simulation results of this new technique are compared with Eldo RF and Spectre RF based on linear circuit concepts and experimental result reported in the literature.