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首页> 外文期刊>IEEE Transactions on Microwave Theory and Techniques >Reduction of Phase Noise in Fractional-N Frequency Synthesizer Using Self-Injection Locking Loop
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Reduction of Phase Noise in Fractional-N Frequency Synthesizer Using Self-Injection Locking Loop

机译:使用自喷锁循环减少分数-N频率合成器中的相位噪声

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摘要

Delta-sigma modulation-based fractional-N frequency synthesizers generally suffer from quantization noise, which causes them to exhibit poor phase-noise performance outside their loop bandwidth. In this work, a self-injection locking (SIL) loop is utilized in a fractional-N frequency synthesizer. The SIL loop can reduce the noise that is generated by the injection-locked oscillator (ILO), the reference signal, and the delta-sigma modulator, greatly improving the phase-noise performance of the fractional-N frequency synthesizer. Experimental results demonstrate that the phase noise in the developed 2.4-GHz fractional-N frequency synthesizer is reduced by up to 36.5 dB using a 17-ns SIL loop. This great reduction of phase noise enables the developed synthesizer to have a very low phase noise of -110, -136, and -145 dBc/Hz at the offset frequencies of 100 kHz, 1 MHz, and 10 MHz, respectively.
机译:基于Delta-Sigma调制的分数-N频率合成器通常遭受量化噪声,这导致它们在环路带宽之外表现出较差的相位噪声性能。在这项工作中,在分数N频率合成器中使用自喷锁定(SIL)环。 SIL循环可以减少由注射锁定振荡器(ILO),参考信号和DELTA-SIGMA调制器产生的噪声,大大提高了分数-N频率合成器的相位噪声性能。实验结果表明,使用17-NS SIL循环,开发的2.4-GHz分数-N频率合成器中的相位噪声减少了36.5dB。相位噪声的这种大量减少使得开发的合成器能够分别具有100kHz,1MHz和10MHz的偏移频率的-110,136和-145dBc / Hz的非常低的相位噪声。

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