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首页> 外文期刊>IEEE Transactions on Geoscience and Remote Sensing >Surface Roughness-Induced Spectral Degradation of Multi-Spaceborne Solar Diffusers Due to Space Radiation Exposure
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Surface Roughness-Induced Spectral Degradation of Multi-Spaceborne Solar Diffusers Due to Space Radiation Exposure

机译:由于空间辐射暴露,导致多星载太阳漫射器表面粗糙度引起的光谱降解

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摘要

Solar diffusers (SDs) have often been used as the onboard calibrators for the radiometric calibration of reflective solar band imaging sensors. After being spaceborne, the reflectance of SDs is observed to degrade with spectral dependence due to exposure to solar UV and energetic particle radiation. Long-term spectral reflectance data of SDs onboard multiple LEO imaging sensors, such as the Moderate Resolution Imaging Spectroradiometer (MODIS) on Terra and Aqua and the Visible Infrared Imaging Radiometer Suite (VIIRS) on SNPP, are analyzed. The reflectance of SDs on these three instruments degrades faster for the shorter wavelength bands than the longer wavelength bands. The Surface Roughness-induced Rayleigh Scattering (SRRS) model is applied to simulate the SD degradation on these instruments, and the growth of the surface roughness parameter of the SDs is derived. It is determined that the change of surface roughness scale length is tens of nanometers. To show the consistency of roughness growth rates among the SDs on Terra/Aqua MODIS and SNPP VIIRS instruments, the functional dependences of the growth rates are characterized according to the SD exposure time and the stage of surface roughness. It is also found that the flattening or reverse in the growth trend of the surface roughness for these three SDs occurred around the same interval between October 2013 and October 2015. The confirmation of the applicability of SRRS model with the long-term spectral reflectance data from three independent spaceborne SDs facilitates a better understanding of the origin and physical processes of the SD degradation.
机译:太阳漫射器(SD)经常被用作板载校准器,用于反射式太阳波段成像传感器的辐射校准。在太空中传播后,由于暴露于太阳紫外线和高能粒子辐射,观察到SD的反射率随光谱依赖性而降低。分析了多个LEO成像传感器上SD的长期光谱反射率数据,例如Terra和Aqua上的中分辨率成像光谱仪(MODIS)和SNPP上的可见红外成像辐射仪套件(VIIRS)。在这三种仪器上,SD的反射率与较短的波段相比,在较短的波段中衰减更快。应用表面粗糙度诱导的瑞利散射(SRRS)模型来模拟这些仪器上SD的退化,并推导了SD的表面粗糙度参数的增长。可以确定表面粗糙度标度长度的变化为数十纳米。为了显示Terra / Aqua MODIS和SNPP VIIRS仪器上SD的粗糙度增长率的一致性,根据SD暴露时间和表面粗糙度的阶段来表征增长率的功能依赖性。还发现,这三个SD的表面粗糙度的增长趋势趋于平坦或逆转发生在2013年10月至2015年10月的同一时间间隔附近。SRRS模型的长期光谱反射率数据证实了其适用性三个独立的星载SD有助于更好地了解SD退化的起源和物理过程。

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