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首页> 外文期刊>International Journal of Materials and Chemistry >Synthesis, Characterization and Dielectric Properties of K1-xNaxNbO3
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Synthesis, Characterization and Dielectric Properties of K1-xNaxNbO3

机译:K 1-x Na x NbO 3 的合成,表征和介电性能

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摘要

The samples of K1-xNaxNbO3 (X=0.4, 0.2, 0) ceramics (PSN) have been prepared by the conventional solid-state reaction method and sintering process. The prepared samples have been characterized by XRD. All the prepared samples show orthorhombic structure at room temperature. Dielectric and Electrical properties of PSN system have been investigated in the temperature range 450C-2450C, and at 1MHz frequency. It is observed that dielectric constant, loss tangent and electrical conductivity increases with increasing temperature. Near the transition temperature dielectric constant, loss tangent and electrical conductivity of these samples show anomalous behaviour with temperature.
机译:K 1-x Na x NbO 3 (X = 0.4,0.2,0)陶瓷(PSN)的样品已通过常规的固态反应方法和烧结工艺。制备的样品已经通过XRD表征。所有制备的样品在室温下均显示正交晶结构。研究了PSN系统在45° 0 C-245 0 C的温度范围和1MHz频率下的介电性能。观察到,介电常数,损耗角正切和电导率随温度升高而增加。在转变温度附近,这些样品的损耗角正切和电导率显示出随温度的异常行为。

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