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Fast Response Solar-Blind Photodetector with a Quasi-Zener Tunneling Effect Based on Amorphous In-Doped Ga2O3 Thin Films

机译:基于非晶态掺杂Ga2O3薄膜的准增能隧穿效应的快速响应日盲光电探测器

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摘要

A high-performance solar-blind photodetector with a metal–semiconductor–metal structure was fabricated based on amorphous In-doped Ga O thin films prepared at room temperature by radio frequency magnetron sputtering. The photodetector shows a high responsivity (18.06 A/W) at 235 nm with a fast rise time (4.9 μs) and a rapid decay time (230 μs). The detection range was broadened compared with an individual Ga O photodetector because of In doping. In addition, the uneven In distribution at different areas in the film results in different resistances, which causes a quasi-Zener tunneling internal gain mechanism. The quasi-Zener tunneling internal gain mechanism has a positive impact on the fast response speed and high responsivity.
机译:基于在室温下通过射频磁控溅射制备的非晶In掺杂Ga O薄膜,制造了具有金属-半导体-金属结构的高性能日盲光电探测器。光电探测器在235 nm处显示高响应度(18.06 A / W),具有快速上升时间(4.9μs)和快速衰减时间(230μs)。与In Ga掺杂相比,与单个Ga O光电检测器相比,检测范围扩大了。此外,薄膜中不同区域的In分布不均匀会导致不同的电阻,从而导致准Zener隧穿内部增益机制。准Zener隧穿内部增益机制对快速响应速度和高响应度具有积极影响。

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