基于蚁群算法的时序电路测试生成研究

摘要

Ant colony algorithm is a new type of optimization algorithm, a framework for solving combinatorial optimization problems is provided, but there are defects which may lead to fall into local optimal solution. In the applications of test generation of the sequential circuit, by means of limiting the concentration range of pheromone and adaptive changes in the pheromone evaporation factor and ensuring the convergence rate, the ant colony algorithm, overcome these shortcomings and its global search capability has been improved. Experimental results show that test generation based on ant colony algorithm obtain a high fault coverage and faster speed of test generation and can meet the application requirements.%蚁群算法是一种新型进化算法,它提供了解决组合优化问题的框架,但存在着易陷入局部最优解的缺陷.在时序电路测试生成的应用中,通过限制信息素浓度变化范围以及自适应改变信息素挥发因子,在保证算法收敛速度的条件下,提高了算法的全局搜索能力,克服了上述缺陷.实验结果表明,基于该箅法的测试生成取得了较高的故障覆盖率和较快的测试生成速度,能够满足实际应用需求.