首页> 外文学位 >Generalized ellipsometry analysis of anisotropic nanoporous media: Polymer-infiltrated nanocolumnar and inverse-column polymeric films.
【24h】

Generalized ellipsometry analysis of anisotropic nanoporous media: Polymer-infiltrated nanocolumnar and inverse-column polymeric films.

机译:各向异性纳米多孔介质的广义椭偏分析:聚合物渗透的纳米柱和反柱聚合物膜。

获取原文
获取原文并翻译 | 示例

摘要

Characterization of the structural and optical properties is a subject of significance for nanoporous material research. However, it remains a challenge to find non-destructive methods for investigating the anisotropy of porous thin films with three-dimensional nanostructures. In this thesis, a generalized ellipsometry (GE) analysis approach is employed to study two types of anisotropic nanoporous media: slanted columnar thin films (SCTFs) with polymer infiltration and inverse-SCTF polymeric films. The thesis presents the physical properties obtained from GE analysis, including porosity, columnar shape, principal optical constants, birefringence, etc..;The thesis reports on using a GE analysis approach, combining the homogeneous biaxial layer approach (HBLA) and anisotropic Bruggeman effective medium approximation (AB-EMA), to determine the changes in structural and optical properties of highly porous SCTFs upon polymer infiltration. Via spin-coating, poly(-methyl methacrylate) (PMMA) was infiltrated into the permalloy SCTFs prepared by glancing angle deposition (GLAD). The Mueller matrix GE measurements were conducted on the SCTFs before and after PMMA infiltration. The obtained film thickness and columnar slanting angle show changes due to infiltration which are in good agreement with scanning electron microscopy (SEM) analysis. The method effectively identifies the changes in birefringence and dichroism upon infiltration, and provides constituent fractions consistent with the performed experiments.;GE analysis is further utilized to characterize the biaxial optical responses of the porous polymer thin films. The porous polymer films with inverse columnar structure (PMMA iSCTFs) were prepared via infiltrating polymer into the voids of the SCTF templates and selectively removing the columns. The AB-EMA was employed to analyze the GE data of the porous polymer films and SCTF templates to determine the structural and anisotropic optical properties. The structural parameters are highly consistent with SEM results. The classification and structure of optical anisotropy are found to be identical for the samples. Our GE results demonstrate that the anisotropic optical behaviors for the two complementary structures follow the reciprocity principle in electrodynamics.
机译:结构和光学性质的表征是纳米多孔材料研究的重要课题。然而,寻找无损方法研究具有三维纳米结构的多孔薄膜的各向异性仍然是一个挑战。本文采用广义椭偏分析法研究了两种类型的各向异性纳米多孔介质:具有聚合物浸润作用的斜柱状薄膜(SCTF)和反SCTF聚合物膜。本文介绍了通过GE分析获得的物理性质,包括孔隙率,柱状形状,主要光学常数,双折射等。论文报道了使用GE分析方法,将均匀双轴层方法(HBLA)和各向异性布鲁格曼有效方法相结合的方法。介质近似(AB-EMA),以确定聚合物渗透后高度多孔的SCTF的结构和光学性质的变化。通过旋涂,将聚(甲基丙烯酸甲酯)(PMMA)渗透到通过掠角沉积(GLAD)制备的坡莫合金SCTF中。在PMMA渗透之前和之后,对SCTF进行Mueller基质GE测量。所获得的膜厚度和柱状倾斜角显示出由于渗透引起的变化,这与扫描电子显微镜(SEM)分析非常吻合。该方法有效地识别了渗透时双折射和二色性的变化,并提供了与所进行的实验一致的组成部分。; GE分析被进一步用于表征多孔聚合物薄膜的双轴光学响应。通过将聚合物渗透到SCTF模板的空隙中并有选择地除去色谱柱来制备具有反向柱状结构的多孔聚合物膜(PMMA iSCTF)。 AB-EMA用于分析多孔聚合物薄膜和SCTF模板的GE数据,以确定结构和各向异性的光学性能。结构参数与SEM结果高度一致。发现光学各向异性的分类和结构对于样品是相同的。我们的GE结果表明,两个互补结构的各向异性光学行为遵循电动力学的互易原理。

著录项

  • 作者

    Liang, Dan.;

  • 作者单位

    The University of Nebraska - Lincoln.;

  • 授予单位 The University of Nebraska - Lincoln.;
  • 学科 Materials science.;Nanoscience.;Electrical engineering.
  • 学位 Ph.D.
  • 年度 2015
  • 页码 120 p.
  • 总页数 120
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号