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Step tunneling enhanced asymmetry in metal-insulator-insulator-metal (MUM) diodes for rectenna applications

机译:整流天线应用中的金属-绝缘体-绝缘体-金属(MUM)二极管中的阶梯隧穿增强了不对称性

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We combine nanolaminate bilayer insulator tunnel barriers (Al_2O_3/HfO_2, HfO_2/Al_2O_3, Al_2O_3/ZrO_2) deposited via atomic layer deposition (ALD) with asymmetric work function metal electrodes to produce MUM diodes with enhanced Ⅰ-Ⅴ asymmetry and non-linearity. We show that the improvements in MUM devices are due to step tunneling rather than resonant tunneling. We also investigate conduction processes as a function of temperature in MIM devices with Nb_2O_5 and Ta_2O_5 high electron affinity insulators. For both Nb_2O_5 and Ta_2O_5 insulators, the dominant conduction process is established as Schottky emission at small biases and Frenkel-Poole emission at large biases. The energy depth of the traps that dominate Frenkel-Poole emission in each material are estimated.
机译:我们将通过原子层沉积(ALD)沉积的纳米叠层双层绝缘子隧道势垒(Al_2O_3 / HfO_2,HfO_2 / Al_2O_3,Al_2O_3 / ZrO_2)与不对称功函数金属电极相结合,以生产具有增强的Ⅰ-Ⅴ不对称性和非线性的MUM二极管。我们表明,MUM设备的改进是由于逐步隧穿而不是共振隧穿。我们还研究了具有Nb_2O_5和Ta_2O_5高电子亲和力绝缘体的MIM器件中导电过程随温度的变化。对于Nb_2O_5和Ta_2O_5绝缘子,主要的传导过程建立为小偏压下的肖特基发射和大偏压下的Frenkel-Poole发射。估计在每种材料中占主导地位的Frenkel-Poole阱的陷阱的能量深度。

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