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P1581: TO LIVE OR LET DIE?

机译:P1581:生活或让死亡?

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Since 2001 the IEEE PI531 working group aims to provide a test standard for memories that cannot have boundary scan. Currently this P158I activity focuses on test access and test circuitry. This paper will elaborate on the status of the draft standard. It describes the test circuitry and an economic model for users of PI 581 devices is presented. The working group is facing a lack of interest of active participants. Continuation of the P1581 standard is currently under discussion. An introduction to a discussion for the future of PI 581 is given.
机译:自2001年以来,IEEE PI531工作组旨在为无法具有边界扫描的存储器提供测试标准。目前,此P158I活动侧重于测试访问和测试电路。本文将详细说明标准草案的地位。它描述了测试电路和呈现PI 581设备的用户的经济模型。工作组面临积极参与者的缺乏兴趣。目前正在讨论P1581标准的延续。给出了对PI 581未来的讨论介绍。

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