An AVO inversion method based on the structure-related reflection coefficient in frequency domain

摘要

We propose an improved AVO inversion method for the structure-related model for the inversion of the layer thickness and properties. The proposed method uses the propagator matrix method as a theoretical description of the reflection coefficients for the structure-related model by incorporating the frequency content of the wavelet. First, we test the proposed method for a simple thin bed model on the synthetic data for the inversion of layer thickness and porosity, and then investigate the feasibility for the characterization of the fracture zone in the Bakken Formation using the synthetic data. The objective functions present well-defined minima and the inversion results indicate good fits between the true model parameters and the minima of the objective functions.