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Helium irradiation effects for deuterium retention in boron coating films

机译:硼涂膜中氘保留的氦辐照效应

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TDS analyses have been performed in order to examine helium irradiation effects for deuterium retention in boron coating films prepared by PACVD. It is clarified that the deuterium retention is reduced due to the irradiation prior to deuterium. There is no correlation between the retention variations of deuterium and helium, and thus the helium occupation seems hardly to contribute to the reduction. The third peaks in the TDS spectra shift on the high temperature side with the irradiation fluence. It is presumed that helium irradiation forms certain layers by knocking on boron atoms, in which deuterium retention is partly restricted, and trapped deuterium needs higher energy for the desorption.
机译:已经进行了TDS分析,以便检查通过PAPVD制备的硼涂膜中的氘保留的氦辐照效应。澄清,由于氘之前的辐射,氘保持率降低。氘和氦的保留变化之间没有相关性,因此氦占用似乎几乎没有导致减少。 TDS光谱中的第三峰随着照射辐射的高温侧。假设氦辐射通过敲击硼原子来形成某些层,其中氘保持部分限制,并且被困的氘需要更高的解吸能量。

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