Abstract: In this paper, a compact microscope system for direct strain measurement is presented. It involves the grating diffraction method coupled with microscopy and image processing technique. A Leitz optical transmitting microscope with white light source is reconstructed by developing a loading and recording system. Gratings with median density from 40 - 200 l/mm are used. With the help of a Bertrand lens, the Fourier spectrum of the grating, not the grating image is formed on the CCD sensor plane with high image quality. A software which can precisely, quickly and automatically determine the diffraction spot centroids is developed. The local strain is measured with high spatial resolution. A discussion on improving the sensitivity in multiple ways is suggested. !10
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机译：摘要：本文提出了一种用于直接应变测量的紧凑型显微镜系统。它涉及光栅衍射法，显微技术和图像处理技术。通过开发装载和记录系统，可以重建带有白光源的Leitz光学透射显微镜。使用中密度为40-200 l / mm的光栅。在Bertrand透镜的帮助下，光栅的傅立叶光谱（而不是光栅图像）会以高图像质量形成在CCD传感器平面上。开发了可以精确，快速，自动确定衍射点质心的软件。以高空间分辨率测量局部应变。建议以多种方式提高灵敏度。 ！10
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