BS PD ISO/TS 11888:2017 Nanotechnologies. Characterization of multiwall carbon nanotubes. Mesoscopic shape factors

纳米技术 多壁碳纳米管的表征 介观形状因子

基本信息

标准号
BS PD ISO/TS 11888:2017
标准状态
现行
发布单位或类别
英国-英国标准学会(GB-BSI);
发布日期
-
实施日期
-
废止日期
-
CCS分类
-
ICS分类
-

研制信息

起草单位
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起草人
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归口单位
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摘要

BS PD ISO/TS 11888:2017 describes methods for the characterization of mesoscopic shape factors of multiwallcarbon nanotubes (MWCNTs). Techniques employed include scanning electron microscopy (SEM),transmission electron microscopy (TEM), viscometry, and light scattering analysis.This document also includes additional terms needed to define the characterization of static bendingpersistence length (SBPL). Measurement methods are given for the evaluation of SBPL, which generallyvaries from several tens of nanometres to several hundred micrometres.Well-established concepts and mathematical expressions, analogous to polymer physics, are utilizedfor the definition of mesoscopic shape factors of MWCNTs.Cross References:ISO 9276-6:2008 Ed 1ISO/TR 12885:2008 Ed 1ISO/TS 80004-3:2010All current amendments available at time of purchase are included with the purchase of this document. BS PD ISO/TS 11888:2017描述了表征多壁材料介观形状因子的方法碳纳米管(MWCNT)。使用的技术包括扫描电子显微镜(SEM),透射电子显微镜(TEM)、粘度计和光散射分析。本文件还包括定义静态弯曲特性所需的附加术语持久性长度(SBPL)。给出了评估SBPL的测量方法,通常从几十纳米到几百微米不等。采用了与聚合物物理类似的成熟概念和数学表达式用于定义多壁碳纳米管的介观形状因子。交叉引用:ISO 9276-6:2008 Ed 1ISO/TR 12885:2008 Ed 1ISO/TS 80004-3:2010购买本文件时可获得的所有现行修订均包含在购买本文件中。 展开▼

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