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SYSTEM AND METHOD FOR BUILT IN TEST FOR OPTICAL SENSORS

机译:用于光学传感器测试的系统和方法

摘要

An optical system including one or more optical sensors and a processing unit capable of performing built-in tests of the optical sensor(s) and methods thereof are disclosed. The processing unit includes a built-in test module configured to detect a reduction of an optical quality of at least some of the images generated by at least one of the optical sensors with respect to an expected optical quality thereof. The built-in test module may be configured to determine whether the reduction of the optical quality thereof is due to the “external optical disturbances” (EOD) and/or failure of the optical sensor(s)/system. The processing unit may include a relative built-in test module configured to compare at least some images generated by at least two of the optical sensor(s) and to determine which of the at least two optical sensors thereof, if any, is subjected to at least one of the EOD and/or failure.
机译:公开了一种光学系统,包括一个或多个光学传感器和能够执行光学传感器的内置测试的处理单元及其方法。 处理单元包括内置测试模块,该内置测试模块被配置为检测相对于其预期光学质量的至少一个光学传感器产生的至少一些图像的光学质量的减小。 内置测试模块可以被配置为确定其光学质量的降低是由于“外部光学干扰”(EOD)和/或光学传感器/系统的故障。 处理单元可以包括相对内置的测试模块,该测试模块被配置为比较至少两个光学传感器生成的至少一些图像,并确定其至少两个光学传感器(如果有的话)经受 至少一个EOD和/或失败。

著录项

  • 公开/公告号EP3759909A4

    专利类型

  • 公开/公告日2021-12-01

    原文格式PDF

  • 申请/专利权人 RAIL VISION LTD;

    申请/专利号EP20190760367

  • 发明设计人 HANIA SHAHAR;

    申请日2019-02-27

  • 分类号H04N5/217;B61L15;B61L23/04;G06K9;H04N5/232;H04N5/247;H04N7/18;H04N17;

  • 国家 EP

  • 入库时间 2022-08-24 22:17:15

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