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Enhanced chemical characterization of solid matrices using x-ray fluorescence and optical color reflectance
Enhanced chemical characterization of solid matrices using x-ray fluorescence and optical color reflectance
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机译:使用X射线荧光和光学反射增强固体基质的化学表征
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摘要
An apparatus or method determines a content of the one or more elements of a solid matrix by scanning the solid matrix using a PXRF spectrometer and a color sensor, receiving a PXRF spectra from the PXRF spectrometer and a numerical color data from the color sensor, extracting a value for each of the one or more elements the PXRF spectra, determining the content of the one or more elements of the solid matrix using one or more processors and a predictive model that relates the value of each of the one or more elements and the numerical color data to the content of the one or more elements of the solid matrix, and providing the content of the one or more elements of the solid matrix to one or more input/output interfaces.
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