首页> 外国专利> Method and device for testing reading and writing ability

Method and device for testing reading and writing ability

机译:用于测试阅读和写入能力的方法和装置

摘要

To provide a test method and device that improve the efficiency of reading and writing ability.SOLUTION: A reading and writing ability test method includes the steps of: acquiring a subject's reading and writing test data generated when the subject writes via an input device from the input device; acquiring a test value of at least one reading and writing ability index for the subject based on the reading and writing test data; and determining a level of the subject's reading and writing ability by the test value of the at least one reading and writing ability index.EFFECT: It is possible to improve the test efficiency of reading and writing ability.SELECTED DRAWING: Figure 2B
机译:提供提高读取和写入能力效率的测试方法和设备。绘图和写入能力测试方法包括以下步骤:获取受试者通过输入设备写入时生成的读取和写入测试数据 输入设备; 基于读取和写入测试数据获取对象的至少一个读取和写入能力指数的测试值; 并通过至少一个读取和写入能力指数的测试值确定受试者读取和写入能力的水平.Ed.effect:可以提高读取和写入能力的测试效率。选择图:图2B

著录项

  • 公开/公告号JP6961022B2

    专利类型

  • 公开/公告日2021-11-05

    原文格式PDF

  • 申请/专利号JP20200004302

  • 发明设计人 高 芸;徐 健;

    申请日2020-01-15

  • 分类号G06Q50/20;G09B7/02;G09B19;

  • 国家 JP

  • 入库时间 2022-08-24 22:07:58

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号