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COMPOSITION ANALYZER OF ELECTRONIC/ELECTRICAL EQUIPMENT PARTS WASTE, TREATMENT DEVICE OF ELECTRONIC/ELECTRICAL EQUIPMENT PARTS WASTE, AND TREATMENT METHOD OF ELECTRONIC/ELECTRICAL EQUIPMENT PARTS WASTE
COMPOSITION ANALYZER OF ELECTRONIC/ELECTRICAL EQUIPMENT PARTS WASTE, TREATMENT DEVICE OF ELECTRONIC/ELECTRICAL EQUIPMENT PARTS WASTE, AND TREATMENT METHOD OF ELECTRONIC/ELECTRICAL EQUIPMENT PARTS WASTE
Provided is an apparatus for analyzing composition of electronic and electrical device part scraps which can determine a composition of part scraps in the electronic and electrical device part scraps in a short time, a device for processing electronic and electrical device part scraps, and a method for processing electronic and electrical device part scraps using those devices. An apparatus for analyzing a composition of electronic and electrical device part scraps including a classification data storage means for storing a classification data for extracting images of a plurality of component types of electronic and electrical device part scraps from a captured image of electronic and electrical device part scraps composed of the plurality of component types and classifying extracted images into each of the plurality of component types, a classification means for classifying the extracted images into each of the plurality of component types extracted from the captured image of the electronic and electrical device part scraps according to the classification data, and analysis means for analyzing at least one of an area, a number, an average particle size, and weight ratio of each of the plurality of component types classified by the classification means.
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